Dear Colleagues, 

We are organizing a focused symposium on "Real-time Characterization of Materials Under Dynamic Deformation" at the Mach conference, April 6-8, 2022. We welcome your abstracts for the contributed talks. The abstract submission deadline for the Mach conference is Jan 2, 2022; please check at https://machconference.org/.

Real-time characterization of materials under dynamic deformation 

Organizers: 

Prof. Avinash M. Dongare, University of Connecticut, CT, USA 

Dr. Cyril L. Williams, US Army Research Laboratory, APG, Maryland, USA 

Dr. Avanish Mishra, University of Connecticut, CT, USA

Description: The in-situ characterization can detail the complex mechanistic and microstructural history that led to the final state of a material under dynamic deformation without any artifacts of sample preparation. These state-of-the-art methods have significantly enhanced the ability to acquire real-time evidence of the dynamic deformation modes active in the microstructure, such as dislocations, twinning, phase transformations, recrystallization, etc. Besides, any complexity related to the interpretation of these in-situ characterizations can be addressed by relatively inexpensive simulations. In combination with modeling, the virtual characterization approach provides a unique opportunity to expedite and/or complement the findings from real-time experimental characterization methods under dynamic deformation. The insights gained from in-situ techniques (experiment and modeling) could also be utilized to validate and improve the applicability of existing plasticity models. This symposium provides an opportunity to discuss recent advancements in the current real-time characterization techniques and set goals for future development.

 Areas of interest for the symposium include, but are not limited to: 

• High-speed X-ray and neutron diffraction-based techniques 

• Electron-diffraction based in-situ techniques (SEM, FIB, PED, and TEM)

• In-situ spectroscopy techniques (EDS, WDS, EBSD) 

• Virtual X-ray and Electron diffraction techniques 

• Machine learning approaches for expedited characterization and automation 

• Novel approaches for characterization, fourth-generation x-ray light sources

This symposium highlights some of the recent advances in both experiments and modeling. The symposium welcomes contributed talks/posters to complement the invited talks and to broaden the horizon.